&lt;title&gt;Recent progress in large dynamic resistor arrays&lt;/title&gt;

Cole, Barry E.; Higashi, Robert E.; Ridley, Jeff A.; Holmen, J.; Benser, Earl T.; Stockbridge, Robert G.; Murrer, Robert Lee; Jones, Lawrence E.; Burroughs, Eddie

doi:10.1117/12.280971

Cited by 12 publications

(3 citation statements)

References 2 publications

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“…From a perspective of the structure features of unit cell, there are three different kinds of resistor array technology: the bridge resistor array 3-7 , the thin film resistor array 8,9,10 , and the suspended membrane resistor array [11][12][13][14][15][16][17] . With the developing of the resistor array technology, a number of fundamental limitations in the bridge resistor array and thin film resistor array approach were revealed 1 .…”

Section: Resistor Array Characterizationmentioning

confidence: 99%

The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

Zhao¹,

Fei²,

Yu³

et al. 2011

International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies

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The resistor array devices are commonly used to produce dynamic two dimensional infrared images in the infrared scene projectors. A non-uniformity caused by many factors is the main source of image fixed pattern noise of the projectors based on resistor array devices. A prior non-uniformity correction procedure must be done before the dynamic infrared image generation for the hardware-in-the-loop simulation test and evaluation. In this paper, the developments and details of the non-uniformity correction technologies for resistor array dynamic infrared scene projector are investigated. The research is commenced directed towards understanding the cause of spatially-distributed radiance non-uniformities of resistor array device, and the fundamental elements that underlie the non-uniformity correction technologies in dynamic infrared scene projection system.

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Section: Resistor Array Characterizationmentioning

confidence: 99%

The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

Zhao¹,

Fei²,

Yu³

et al. 2011

International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies

View full text Add to dashboard Cite

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“…Besides that, compared with the energy loss through the thermal conduction along the legs, radiation energy loss could be ignored. So only the thermal conduction along legs was the dominant energy loss, and was taken into consideration in the FEM simulation model to calculate the physical temperature of the device [15]. In sequence, the radiation from the micro plate was calculated by a Matlab program based on Plank's radiation law with the previously calculated physical temperature, with assumption of uniform temperature distribution in the micro plate [16].…”

Section: Micro Structure Designmentioning

confidence: 99%

A design of integrated CMOS-MEMS infrared emitter arrays

Cheng

Toshiyoshi

2016

IEICE Electron. Express

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This paper presents a new design of complementary metaloxide-semiconductor microelectromechanical systems (CMOS-MEMS) infrared (IR) emitter arrays. The infrared emitter array is a key radiation source for various gas sensors. In this work, an IR emitter array has been implemented using the standard CSMC 0.5 µm 2P3M CMOS process. Three different shapes of micro emitters are designed. Heating resistor in each emitter is a moderate resistor composed of tungsten via-chain laminated in the micro structure, which is mechanically released from the substrate surface by the post-CMOS dielectric dry etching and aluminum sacrificial layer wet etching. This design shows a potential to vertically integrate CMOS circuits and MEMS IR emitter within a small footprint. In most CMOS-MEMS similar devices, on the other hand, polysilicon heating resistors were released by bulk silicon etching, which urges the IR emitter to be integrated in a coplanar CMOS circuit with a larger footprint. Thermal properties and radiation properties of the emitters under vacuum condition are calculated in a 2-step sequential simulation. Firstly, steady state temperature response and dynamic temperature response are calculated through multi-physics coupling finite element method (FEM) simulation, and thermal mass and thermal conductance of each micro emitter are derived. Secondly, dynamic radiation responses are also estimated with a Matlab program based on Plank's radiation law. All simulation results supports the evidence that the designed devices are of power efficient and high speed. Read-in circuit is also designed and integrated within each of 8 × 8 emitter array elements.

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“…These pixel structures are replicated in two dimensions to form an array of emitters capable of selective spectral emission across the full MWIR and LWIR wavebands. 6 The latest generation arrays, officially designated Phase III arrays, offer a large format and excellent image quality. The BRITE array is driven using electronics manufactured by CSA and control software written by OSC.…”

Section: Honeywell Brite Array (Emitter For the Wisp Program)mentioning

confidence: 99%

Application of Multiple IR Projector Technologies for AMCOM HWIL Simulations

Beasley¹,

Saylor²

1999

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This paper describes the application of multiple IR projector technologies to Hardware-in-the-Loop (HWIL) simulations at the US Army Aviation and Missile Command's (AMCOM) Missile Research, Development, and Engineering Center (MRDEC). Several projectors utilizing a variety of emerging technologies are currently being successfully applied within the HWIL facilities of AMCOM's MRDEC. Projector technologies utilized at AMCOM include laser diode array projectors (LDAP), Honeywell's bright resistive infrared thermal emitter (BRITE) arrays, an IR zoom projector with thermoscenes, and steerable point source projectors. Future plans include a new resistor array projector called the Multispectral Infrared Animation Generation Equipment (MIRAGE), which is being manufactured by Santa Barbara Infrared. These projector technologies have been used to support multiple HWIL test entries of various seeker configurations. Seeker configurations tested include: two InSb 256x256 FPAs, an InSb 512x512 FPA, a PtSi 640x480 FPA, a PtSi 256x256 FPA, a HgCdTe 256x256 FPA, a scanning linear array, and an uncooled 320x240 microbolometer FPA. The application, capabilities, and performance of each technology are reviewed in the paper. Example imagery collected from each operational system is also presented.Keywords: Infrared, Scene Projection, Diode lasers, Simulation, FPA testing, Hardware-in-the-loop. INTRODUCTIONThe AMCOM Advanced Simulation Center (ASC) provides high-fidelity, value-added HWIL simulation support to Program Executive Officers (PEO) and Project Managers (PM) who are responsible for developing and fielding tactical precision guided missiles and submunitions for the U.S. Army. The ASC is also engaged in cooperative HWIL simulation tasks which support other DoD Agencies, NATO members and other U.S. Allies. This test support focuses primarily on testing missiles/munitions employing infrared, millimeter wave, and microwave sensors and seekers. 1The ASC facility is located on Redstone Arsenal, adjacent to Huntsville, Alabama. The ASC consists of 14 HWIL simulation facilities developed over a period of 25 years. These facilities contain special purpose computers, signal generation equipment, projectors, and radiation chambers, supported by signature measurement-based mathematical models. They provide targets signatures, countermeasures, and background scenarios in the microwave, millimeter wave, infrared and visible regions of the electromagnetic spectrum. Some of the programs currently supported include THAAD, Patriot, Army TACMS-BAT, Javelin, EFOG-M, TOW, Stinger, Longbow, and SADARM.The ASC has six simulation facilities for testing systems which utilize IR sensors or seekers. A photograph of one of the facilities is shown in Figure1. The ASC IR HWIL facilities are capable of generating dynamic in-band IR images in realtime using advanced IR projector and scene generation computer equipment. This paper provides an overview of the IR projector technologies utilized within the ASC and the performance capabilities of each s...

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<title>Recent progress in large dynamic resistor arrays</title>

Cited by 12 publications

References 2 publications

The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

A design of integrated CMOS-MEMS infrared emitter arrays

Application of Multiple IR Projector Technologies for AMCOM HWIL Simulations

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