2002
DOI: 10.1117/12.454723
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<title>Shack-Hartmann wavefront sensor for laser beam analyses</title>

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Cited by 31 publications
(6 citation statements)
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“…The Shack-Hartmann wavefront sensor (SHWFS) is one of the most commonly used instruments for measuring optical aberrations in adaptive optic (AO) systems. Besides, it is also used in surface metrology [1], aberration measurements of the human eye [2] and laser beam analysis [3]. The SHWFS utilizes a microlens array to dissect the incoming wavefront into many sub-wavefronts, and light spots are focused by a detector array placed at the focal plane of these microlenses [4].…”
Section: Introductionmentioning
confidence: 99%
“…The Shack-Hartmann wavefront sensor (SHWFS) is one of the most commonly used instruments for measuring optical aberrations in adaptive optic (AO) systems. Besides, it is also used in surface metrology [1], aberration measurements of the human eye [2] and laser beam analysis [3]. The SHWFS utilizes a microlens array to dissect the incoming wavefront into many sub-wavefronts, and light spots are focused by a detector array placed at the focal plane of these microlenses [4].…”
Section: Introductionmentioning
confidence: 99%
“…Zonal wavefront sensing provides a robust way to estimate a wavefront by zonewise sampling of the incident beam cross section. The Shack-Hartmann wavefront sensor (SHWS) [1] is the most widely used zonal wavefront sensor which finds applications in areas such as ophthalmology [2,3], observational astronomy [4], laser beam characterization [5][6][7], optical microscopy [8], optical trapping [9], etc. The SHWS comprises a two dimensional array of tiny lenses, called lenslets, followed by a digital camera.…”
Section: Introductionmentioning
confidence: 99%
“…In FI the surface under test is conjugated to the plane of detector of digital camera to obtain best imaging of fringe pattern; conjugated planes are indicated as dotted lines. Wavefront measurement by SHWFS is based on the measurements of local slopes of a distorted wavefront relative to a reference wavefront [1]. The deviations of the focal spots from some reference positions corresponding to a reference wavefront are measured in each subaperture on a detector array matrix.…”
Section: Introductionmentioning
confidence: 99%