1993
DOI: 10.1117/12.151032
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<title>Thermal comparison of emissive infrared projector devices</title>

Abstract: The three emissive technologies -thin film resistor, silicon bridge resistor and suspended membrane resistor -currently being investigated for dynamic infrared projection applications are thermally compared and contrasted. It is shown that the technologies may be compared quantitatively in terms of both the strong power/speed trade-off that exists and the maximum effective blackbody temperature capability. The suspended membrane technology is shown to be superior in thermal terms, followed by the thin film tec… Show more

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Cited by 6 publications
(2 citation statements)
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“…The calculational methods by which this supposition may be confirmed are based on an extension of the analysis described in reference 7. The LWIR correlation is found to be particularly good Now, under small signal conditions eqn (4) holds and therefore the above approximation reduces to c5(LTeff) 2 (6) Indeed, this result is also largely true at higher values of LiTa , as can be confirmed by calculated examples.…”
Section: Emissive Projectorssupporting
confidence: 61%
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“…The calculational methods by which this supposition may be confirmed are based on an extension of the analysis described in reference 7. The LWIR correlation is found to be particularly good Now, under small signal conditions eqn (4) holds and therefore the above approximation reduces to c5(LTeff) 2 (6) Indeed, this result is also largely true at higher values of LiTa , as can be confirmed by calculated examples.…”
Section: Emissive Projectorssupporting
confidence: 61%
“…In contrast, the bridge resistor designs are clearly not optimized with respect to spectral emissivity. 6 ISPIE Vol. 2469…”
Section: Optical Interferencementioning
confidence: 99%