<title>Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors</title>

Abstract

This paper presents an approach for noise characterization ofread-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.