<title>Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms</title>

Abstract

Various interferometnc and fringe projection techniques may result in complex interferograms with the information about the phenomena tested. Recent applications require the analysis on the base of a single interferogram. Here, we address two problems: simultaneous analysis of the information about two events and analysis of interferogram with high phase gradients in both x and y directions. The analysis of an interferogram is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the two procedures proposed is presented.

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

“…With the spatial version of phase shifting, the pixels surrounding the pixel at which the phase is calculated are considered as containing all the same phase, plus a multiple of a constant phase shift equal to , where N is the number of pixels used to encode one grid period. Considering spatial phase shifting enables one to use or adapt tools and results obtained with the temporal phase shifting procedure employed to process fringes, see for instance. Concerning the phase shifting problem, Ref.…”