Coactivation of oxyorthosilicates of X2 type of the system Lu2–xYxSiO5:Cey3+ with either Sm3+ or Zr4+ introduces charge trapping defect centres. These centres are able to store carriers after X‐ray irradiation. Photostimulation and/or thermal stimulation results in radiative relaxation of the activator Ce3+. Models for the storage mechanism are suggested.