2017
DOI: 10.1039/c7ce01239j
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Luminescence characterizations of freestanding bulk single crystalline aluminum nitride towards optoelectronic application

Abstract: Freestanding wurtzite aluminum nitride bulk single crystals were massively grown, exhibiting deep UV band edge and broad defect-related emissions.

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Cited by 18 publications
(15 citation statements)
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“…The XRD pattern in Figure 2d shows strong peak at 36.09° and weak peak at 76.60°, representing (002) plane and (004) plane of wurtzite structure AlN crystal respectively and indicating that the AlN crystal are grown along the c ‐axis orientation (JCPDS card No.25–1133). [ 5 ] Regular hexagonal steps are observed on the crystal surface (Figure 2e), which match well with the wurtzite crystal lattice structure and illustrate step‐flow growth mode by this method. [ 26 ] Figure 2f shows the cross‐section of AlN crystal on W substrate.…”
Section: Resultssupporting
confidence: 56%
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“…The XRD pattern in Figure 2d shows strong peak at 36.09° and weak peak at 76.60°, representing (002) plane and (004) plane of wurtzite structure AlN crystal respectively and indicating that the AlN crystal are grown along the c ‐axis orientation (JCPDS card No.25–1133). [ 5 ] Regular hexagonal steps are observed on the crystal surface (Figure 2e), which match well with the wurtzite crystal lattice structure and illustrate step‐flow growth mode by this method. [ 26 ] Figure 2f shows the cross‐section of AlN crystal on W substrate.…”
Section: Resultssupporting
confidence: 56%
“…[ 1–4 ] AlN has unique physical and chemical properties, including ultra‐wide direct bandgap (6.2 eV), high breakdown voltage, high thermal conductivity, and chemical stability desirable properties, which is the most promising candidate for DUV optoelectronics and electronic devices working under high temperature and high‐power high‐frequency. [ 5 ] Since the lattice constants and thermal expansion coefficients of hexagonal AlN (h‐AlN) are close to the hexagonal GaN (h‐GaN), AlN is a suitable substrate for the fabrication of optoelectronic devices based on AlN/GaN heterojunction or AlGaN epitaxial layers, such as DUV light‐emitting diodes and sensors, surface acoustic wave devices and high electron mobility transistors (HEMT). [ 3,6–8 ]…”
Section: Introductionmentioning
confidence: 99%
“…On the contrary, exorbitant supersaturation leads to defective densities and high-density nucleation points that fabricate polycrystalline AlN. Many experiments with different T and ΔT were carried out to investigate the adequate supersaturation range [7,8,11]. It has been proven that detached freestanding high-quality AlN single crystals with large size can be obtained when the values of supersaturation are between 0.25 and 0.3 [8].…”
Section: Resultsmentioning
confidence: 99%
“…These results show that a reverse temperature field method can control AlN nucleation and is a promising PVT growth method for large-size single crystal of AlN on polycrystaline tungsten substrates. Now, a AlN single crystal with a diameter up to 2.2 ceti-meters has been fabricated with optimizing experimental parameters [7].…”
Section: Resultsmentioning
confidence: 99%
“…Specifically, the quality improvement of the AlN single crystal is beneficial to the development and performance enhancement of deep-ultraviolet and even vacuum-ultraviolet photodetectors [ 7 , 8 ]. Owing to the advantage of excellent electrical properties, high temperature and pressure resistance, extremely high piezoelectric effect, and high electron mobility, AlN is attractive for the application of high-temperature, high-frequency and high-power devices [ 9 , 10 ]. Moreover, the lattice constant and thermal expansion coefficient of AlN are close to other Ⅲ–Ⅴ materials, thereby making it suitable as a substrate for the epitaxial growth of materials, such as GaN and AlGaN [ 11 ].…”
Section: Introductionmentioning
confidence: 99%