2000
DOI: 10.1117/12.379338
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Luminescence investigation of SiO 2 surfaces damaged by 0.35-nm laser illumination

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Cited by 19 publications
(9 citation statements)
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“…It has been shown that the laser damage process leads to the formation of a layer of modified material inside the damage crater. [10][11][12] The damage site can nominally include three different sectors: a layer with a modified chemical composition, a layer of mechanically damaged material (crushed, compressed) and a surrounding region of extended cracks. Although numerous previous studies have focused on the mechanisms of LID initiation in as-grown KDP crystals, the properties of the material modified during laser-induced breakdown have received little attention.…”
Section: Introductionmentioning
confidence: 99%
“…It has been shown that the laser damage process leads to the formation of a layer of modified material inside the damage crater. [10][11][12] The damage site can nominally include three different sectors: a layer with a modified chemical composition, a layer of mechanically damaged material (crushed, compressed) and a surrounding region of extended cracks. Although numerous previous studies have focused on the mechanisms of LID initiation in as-grown KDP crystals, the properties of the material modified during laser-induced breakdown have received little attention.…”
Section: Introductionmentioning
confidence: 99%
“…All the spectra on the studied surface flaws show the presence of at least two or three luminescence bands. If two of them have been previously studied in detail and attributed to specific defects in glass silica (1.89 eV: NBOHC and 2.75 eV: ODC), the band at 2.25 eV found in indentation, laser damage, and probably to a very less extent on pristine silica is not clearly interpreted though already observed in laser damage [8,9]. Even if the 2.75 eV band is unambiguously attributed to ODC [5,8,9], it must be noticed that under 3.81 eV excitation, only low yield luminescence should be observed.…”
Section: Discussionmentioning
confidence: 99%
“…The band at 2.75 eV is known to be induced by ODC defects [5,9,11]. We measure a FWHM of 0.75 eV for this peak.…”
Section: High Purity Silicamentioning
confidence: 99%
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“…LID is often observed to initiate at the rear surface of fused silica pellicles when acting as a beamsplitter, the physical nature of which is not well understood at present. [1][2][3][4] Nanosecond and subnanosecond laser pulses can induce thermally dominated or shock wave compression damages which can last several nanoseconds after the laser pulse. 5 Moreover, the occurring of rearsurface damages could also be associated to the presence of hot spots in the focused damaging beam and/or to selffocusing and filamentation mechanisms in the bulk.…”
Section: Introductionmentioning
confidence: 99%