2012
DOI: 10.1088/0953-8984/24/43/435503
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Luminescence lifetimes of neutral nitrogen-vacancy centres in synthetic diamond containing nitrogen

Abstract: The decay time of luminescence from neutral nitrogen-vacancy (NV(0)) centres in synthetic diamond is reported. The intrinsic luminescence lifetime of NV (0) is measured as τ(r) = 19 ± 2 ns. Neutral substitutional nitrogen atoms (N(S)(0)) are shown to quench luminescence from NV(0) by dipole-dipole resonant energy transfer at a rate such that the transfer time would equal τ(r) if one (N(S)(0)) atom was ~3 nm from the NV(0). In chemical-vapour-deposited diamonds grown with a small nitrogen content, that are brow… Show more

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Cited by 63 publications
(58 citation statements)
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“…(1) while a radiative lifetime for NV − centers of (12 ± 1 ns) was taken from the literature, 46 the radiative lifetime for NV 0 centers was directly measured in an optical-grade N-implanted sample, yielding a value of (17 ± 1 ns), in satisfactory agreement with the literature; 47 (2) the dipole-dipole resonant energy transfer was successfully applied to model the measured decay times of NV 0 and NV − centers in different experimental conditions, allowing the determination of empirical parameter k and accounting for the strength of the nonradiative coupling between the PL centers under investigation and native/induced defects in the samples; (3) in frontally implanted samples, the variation of the k parameter was reported as a function of ion-induced defect density for both NV 0 and NV − emissions: while a nonmonotonic variation was observed for NV 0 emission, a logarithmic increase of k vs damage density was found for NV − emission for damage levels exceeding a critical threshold determined by the background nitrogen concentration; the data relevant to NV − emission were quantitatively analyzed; (4) in laterally implanted samples, it was possible to map the evolution of the PL lifetime across the sample thickness, thus obtaining direct evidence of the effects of the strongly nonuniform damage profile; the experimental data exhibited a good agreement with numerical prediction based on SRIM simulations combined with the results of the quantitative analysis carried out for frontally implanted samples; (5) in regions implanted at the lowest fluences, a linear dependence was identified between native nitrogen substitutional concentration independently measured by FTIR spectroscopy and the k value; this allowed the attribution of the quenching of NV − emission primarily to nitrogen, although other kinds of native defects cannot be ruled out in principle.…”
Section: Discussionsupporting
confidence: 57%
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“…(1) while a radiative lifetime for NV − centers of (12 ± 1 ns) was taken from the literature, 46 the radiative lifetime for NV 0 centers was directly measured in an optical-grade N-implanted sample, yielding a value of (17 ± 1 ns), in satisfactory agreement with the literature; 47 (2) the dipole-dipole resonant energy transfer was successfully applied to model the measured decay times of NV 0 and NV − centers in different experimental conditions, allowing the determination of empirical parameter k and accounting for the strength of the nonradiative coupling between the PL centers under investigation and native/induced defects in the samples; (3) in frontally implanted samples, the variation of the k parameter was reported as a function of ion-induced defect density for both NV 0 and NV − emissions: while a nonmonotonic variation was observed for NV 0 emission, a logarithmic increase of k vs damage density was found for NV − emission for damage levels exceeding a critical threshold determined by the background nitrogen concentration; the data relevant to NV − emission were quantitatively analyzed; (4) in laterally implanted samples, it was possible to map the evolution of the PL lifetime across the sample thickness, thus obtaining direct evidence of the effects of the strongly nonuniform damage profile; the experimental data exhibited a good agreement with numerical prediction based on SRIM simulations combined with the results of the quantitative analysis carried out for frontally implanted samples; (5) in regions implanted at the lowest fluences, a linear dependence was identified between native nitrogen substitutional concentration independently measured by FTIR spectroscopy and the k value; this allowed the attribution of the quenching of NV − emission primarily to nitrogen, although other kinds of native defects cannot be ruled out in principle.…”
Section: Discussionsupporting
confidence: 57%
“…In a subsequent work, also the dipole-dipole resonant energy transfer from NV 0 centers to neutral substitutional nitrogen was investigated in detail. 47 Several previous works report extensively about the effect on the intensity of NV centers of structural defects induced from neutron, 58 electron, 59 and ion 16 irradiation, and it is natural to assume that also the center lifetime is affected by radiation-induced damage. While a 2-MeV electron irradiation at a fluence of 2 × 10 18 cm −2 does not seem to have significant effects on the center lifetime, 40 in the present work we report a systematic investigation on the effect of ion implantation on NV center lifetime in samples characterized by different substitutional nitrogen concentrations.…”
Section: Theorymentioning
confidence: 99%
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“…2(a) of Ref. [36]. Photoluminescence studies also show that the vibrations of NV 0 involve one phonon with an energy of 42 meV [37].…”
Section: Intrinsic Distortion Pathmentioning
confidence: 89%