2013
DOI: 10.1109/jphotov.2012.2213579
|View full text |Cite
|
Sign up to set email alerts
|

Luminescent Coupling in GaAs/GaInNAsSb Multijunction Solar Cells

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
40
1

Year Published

2014
2014
2021
2021

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 61 publications
(42 citation statements)
references
References 14 publications
1
40
1
Order By: Relevance
“…The simulation results produced a best fit to the measured data with simulation values of between 0.56 and 0.58, very close to the value calculated using a lumped model analysis, which was 0.55 [1]. Fig 2. shows the comparison of the 2J cell simulation results with set to different values.…”
Section: Model Verificationsupporting
confidence: 74%
See 3 more Smart Citations
“…The simulation results produced a best fit to the measured data with simulation values of between 0.56 and 0.58, very close to the value calculated using a lumped model analysis, which was 0.55 [1]. Fig 2. shows the comparison of the 2J cell simulation results with set to different values.…”
Section: Model Verificationsupporting
confidence: 74%
“…This value is considered close to the coupling factors in real cells and suffices to demonstrate the effects of luminescent coupling [1] [3]. For comparison, we simulated the same cell under two other conditions.…”
Section: Simulations With 3-d Luminescent Couplingmentioning
confidence: 83%
See 2 more Smart Citations
“…This could be a result of luminescent coupling from the AlGaAs filter into the InGaAsN(Sb) absorber 11 and will not necessarily contribute photocurrent in an operating four-junction device, unless the junctions with larger band gaps are producing an excess of photocurrent. 18 To characterize the InGaAsN(Sb) junctions in a nearly as-grown condition with minimal annealing, a set of "fast-process" samples were prepared from 5m m× 5m mdies cleaved from the as-grown wafer. These samples were prepared with ohmic indium contacts to the top and bottom faces and are sufficient for quantum efficiency measurements, but the contacts are not adequate for operation at high currents.…”
Section: Carrier Collectionmentioning
confidence: 99%