Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits
Ruiqiang Song,
Jinjin Shao,
Yaqing Chi
et al.
Abstract:Transient pulses generated by high-energy particles can cause soft errors in circuits, resulting in spacecraft malfunctions and posing serious threats to the normal operation of spacecraft. For integrated circuits used in space applications, it is necessary to first evaluate soft errors caused by transient pulses. Conventional soft-error-rate evaluation tools are designed to simulate the generation of transient pulses using many accurate models, while the propagation of transient pulses is primarily simulated … Show more
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