2024
DOI: 10.1039/d4dd00215f
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Machine learning for analyzing atomic force microscopy (AFM) images generated from polymer blends

Aanish Paruchuri,
Yunfei Wang,
Xiaodan Gu
et al.

Abstract: In this paper we present a new machine learning (ML) workflow with unsupervised learning techniques to identify domains within atomic force microscopy (AFM) images obtained from polymer films. The goal...

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