“…Macroscale properties of silane films have been characterized by use of Fourier transform infrared (FTIR) spectroscopy (Kessel and Granick, 1991;Kanan et al ., 2002), X-ray photoelectron spectroscopy (Moon et al ., 1997;Allen et al ., 2005;Crampton et al ., 2005;Chen et al ., 2006;Metwalli et al ., 2006;Martin et al ., 2007), UV-vis spectrophotometry (Moon et al ., 1996(Moon et al ., , 1997, ellipsometry (Kurth and Bein, 1995;Moon et al ., 1996Moon et al ., , 1997, and quartz-crystal microbalance measurements (Kurth and Bein, 1995). These methods have provided essential insight into film properties but cannot describe the distribution of available amino groups or the microscale morphology of the film.…”