Macroscopic residual stress and properties in different YBa2Cu3O7-x heterogeneous systems

Yu, Jingfeng; Li, Fang; Fan, Jiangwei; Suleman, Muhammad; Dahal, Yam Prasad; Zhang, Zhuli; Wang, Sansheng

doi:10.1016/j.physc.2020.1353728

Cited by 3 publications

(2 citation statements)

References 24 publications

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“…Jingfeng Yu et al [23] investigated YBCO films prepared on (LaAlO 3 ) 0.3 -(Sr 2 AlTaO 6 ) 0.7 (LSAT), SrTiO 3 , and LaAlO 3 substrates, and the corresponding influence on superconductivity. Internal strain and residual stress were measured by an extended small-angle sin 2 ψ method and the Williamson-Hall plot method, respectively.…”

Section: Xrdmentioning

confidence: 99%

A Review on Strain Study of Cuprate Superconductors

Zhang

Zhao

et al. 2022

Nanomaterials

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Cuprate superconductors have attracted extensive attention due to their broad promising application prospects. Among the factors affecting superconductivity, the effect of strain cannot be ignored, which can significantly enhance or degrade superconductivity. In this review, we discuss and summarize the methods of applying strain to cuprate superconductors, strain measurement techniques, and the influence of strain on superconductivity. Among them, we pay special attention to the study of strain in high–temperature superconducting (HTS) films and coating. We expect this review can guide further research in the field of cuprate superconductors.

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Section: Xrdmentioning

confidence: 99%

A Review on Strain Study of Cuprate Superconductors

Zhang

Zhao

et al. 2022

Nanomaterials

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“…Such studies are carried out on REBCO and YBCO superconducting layers grown on LaAlO 3 and SrTiO 3 single-crystal substrates [8][9][10][11]. In terms of technology, these layers have little in common with real layers in HTS-2G wires, so the results obtained should be treated critically.…”

Section: Introductionmentioning

confidence: 99%

Residual stresses at the interface between carrier tape and YSZ layer in manufacture of 2G HTS wires

et al. 2022

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Using X-ray diffraction, there were determined the residual stresses on the surface of the AISI 310S stainless steel carrier tape used in manufacture of the second generation high temperature superconducting (2G HTS) wires at the National Research Center "Kurchatov Institute", from delivery to deposition of the main buffer layer YSZ between the tape and the superconducting layer, and the residual stress in the buffer layer YSZ itself. The compressive stress of -0.8 GPa induced by rolling was found on the surface of the tape as-delivered. During processing, it varies from -0.5 to -1.1 GPa. At each stage, its depth distribution was found down to 10 μm, and the residual stresses caused by processing were determined. The residual stress in the YSZ layer deposited using the ABAD technology is compressive and amounts to -3.29 GPa. The layer has a defective single-crystal structure in type to radiation swelling with the unstressed lattice period of 5.1820 Angstrem, 0.9% larger than in ordinary crystal. The results obtained are in agreement with the data of the earlier neutron diffraction study of residual stresses inside the carrier tape. Keywords: residual stress, 2G HTS wires, AISI 310S tape, YSZ layer, YSZ crystal structure, X-ray diffraction.

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