Abstract:Double rectangular transmission line model and contact‐end voltage measurement are used to study the variation in sheet resistance and current transfer length of the contact interface between the front‐side electrode and the emitter of crystalline silicon solar cells during metallization. The current distribution and its relationship with the sheet resistances of the electrode, contact interface, and emitter are given at the macrolevel. The model shows that the current flows transversely for ≈50–500 μm in the … Show more
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