Magnetic and robust dielectric properties in distorted double perovskite Gd2CuTiO6

Optical and dielectric properties of divalent copper based double perovskite compound, Gd2CuTiO6

“…From the XRD pattern of GCTO highly crystalline nature is observed which we have reported in our previous article [25]. Rietveld refinement of x-ray diffraction data [25] showed that the title compound crystallized in orthorhombic symmetry with Pnma (#62) space group with a random distribution of Cu/Ti ions on the octahedral sites and the lattice parameters are a = 5.759 (7) Å, b = 7.525 (5) Å and c = 5.365 Å [25]. Morphological scanning electron microscopy images displayed large grains with an average size of 3.5 µm [25].…”

“…Rietveld refinement of x-ray diffraction data [25] showed that the title compound crystallized in orthorhombic symmetry with Pnma (#62) space group with a random distribution of Cu/Ti ions on the octahedral sites and the lattice parameters are a = 5.759 (7) Å, b = 7.525 (5) Å and c = 5.365 Å [25]. Morphological scanning electron microscopy images displayed large grains with an average size of 3.5 µm [25]. EDX analysis (shown in figure 1) is carried out using Gd L α1 , Cu L α1,2 , Ti K α1 and O K α1 sources.…”

“…With this motivation in this article, we have investigated the high temperature dielectric properties and room temperature optical properties on Gd 2 CuTiO 6 (GCTO). Results of our previous study on GCTO by Saha et al [25] showed the structure to be orthorhombic and low temperature dielectric studies (15-300 K) indicated dielectric relaxation. In the present work, we have reported the high temperature dielectric properties and ambient temperature optical properties for the first time to the best of our knowledge.…”

“…Sample was prepared using solid state reaction method [25]. Phase purity and crystal structure were determined using xray powder diffraction technique as described in our earlier publication [25].…”

“…Sample was prepared using solid state reaction method [25]. Phase purity and crystal structure were determined using xray powder diffraction technique as described in our earlier publication [25]. Energy-dispersive x-ray (EDX) spectra are recorded using SEM-EDX SUPRA 55, FEG SEM Carl Zeiss (Germany) with liquid N 2 free analytical drift detector (Oxford Instruments, UK) in order to know the elemental analysis.…”