Magnetic Domain Imaging with Spin-Polarized SEM

Abstract

In spintronics research, high-spatial-resolution, quantitative, (and in some cases) low-temperature observation of magnetic domains together with elements and crystal-direction distribution is important. As per this point of view, spin-polarized scanning electron microscopy is a significantly powerful method. In this section, the principle, apparatus, capabilities and some representative applications of this microscopy method are described.