2010
DOI: 10.1051/epjap/2010048
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Magnetic imaging with spin-polarized low-energy electron microscopy

Abstract: Abstract. Spin-polarized low-energy electron microscopy (SPLEEM) is a technique for imaging magnetic microstructures at surfaces and in thin films. In this article, principles, advantages and limitations of SPLEEM are reviewed. Several recent studies illustrate how SPLEEM can be used to investigate spin reorientation transition phenomena, to determine magnetic domain configurations in low-dimensional structures, or to explore physics of magnetic couplings in layered systems. The work highlights the capability … Show more

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Cited by 116 publications
(94 citation statements)
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“…We focus on Fe/Ni bilayer grown on W(110) substrates, where the very large spin Hall angle of tungsten 23 is combined with two-fold symmetry at the (110) interface and perpendicular magnetic anisotropy of the magnetic layer [24][25][26] . Using spin-polarized low-energy electron microscopy (SPLEEM) [27][28][29] , we observe anisotropic chiral DW spin structures with mixed components of chiral Bloch-and chiral Néel-character. We find that, as a function of the relative orientation of the DWs with respect to the [001] substrate surface direction, the Fe/Ni/W(110) system features chiral Néel walls, mixed chiral walls containing both Néel and Bloch components or non-chiral Bloch walls.…”
mentioning
confidence: 99%
“…We focus on Fe/Ni bilayer grown on W(110) substrates, where the very large spin Hall angle of tungsten 23 is combined with two-fold symmetry at the (110) interface and perpendicular magnetic anisotropy of the magnetic layer [24][25][26] . Using spin-polarized low-energy electron microscopy (SPLEEM) [27][28][29] , we observe anisotropic chiral DW spin structures with mixed components of chiral Bloch-and chiral Néel-character. We find that, as a function of the relative orientation of the DWs with respect to the [001] substrate surface direction, the Fe/Ni/W(110) system features chiral Néel walls, mixed chiral walls containing both Néel and Bloch components or non-chiral Bloch walls.…”
mentioning
confidence: 99%
“…), sensitivity. The most common magnetic microscopies offering spatial resolution below 50 nm and direct sensitivity to magnetization are X-ray Magnetic Circular Dichroism PhotoEmission Electron Microscopy (XMCD-PEEM) [ [7][8][9].Yet another criterion is the volume of the sample probed. This criterium is gaining in importance in the context of the emergence of three-dimensional (3D) magnetic objects and textures.…”
mentioning
confidence: 99%
“…), sensitivity. The most common magnetic microscopies offering spatial resolution below 50 nm and direct sensitivity to magnetization are X-ray Magnetic Circular Dichroism PhotoEmission Electron Microscopy (XMCD-PEEM) [ [7][8][9].…”
mentioning
confidence: 99%
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“…In addition, the high mobility of electrons (> 3x10 6 cm 2 V −1 s −1 ) and their long spin transportation distance (> hundred µm) are suitable properties for spatial imaging of this effect [5,[20][21][22][23]. The electron de Broglie wavelength at the Fermi energy is unusually long, around 20-100 nm [22], making it easy to design a suitable magnetic domain period a and minimize effects caused by nonzero domain wall width [18,19]. Further concern includes suitable materials for the grating formed by magnetic stripe domains.…”
mentioning
confidence: 99%