“…( 1 ), leading to complex variations of S eff versus temperature, since temperature plays differently on carrier trapping/releasing, carrier recombination, and carrier injection. Neglecting the effect of the interface on the concentration of electrons in metallic Mn 5 Ge 3 , and assuming that the main effect of the interface is the modification of the hole concentration ( p ) and the electron concentration ( n ) in the semiconductor, one can roughly assume S h ∝ p −2/3 , S e ∝ n −2/3 5 – 8 , 30 , 32 , 44 , σ h ∝ p , and σ e ∝ n 6 , 30 , 55 , leading to the approximation …”