Abstract:This paper presents a simulation scheme based on the S-parameters for simultaneously predicting the circuit operation of a power module (PM) and its consequent magnetic near-field (NF) strength. The PM comprises silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs). The circuit simulation is carried out using the S-parameterized PM aided by the SiC MOSFET die model, which allows for a precise replication of the switching waveforms. Note that the Sparameterized process needs no meas… Show more
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