“…Domain-size-dependent resistance noise, for example, may be as large as to limit GMR-sensor applications [21]. Therefore, indirect methods like resistance noise [21] and magnetoresistance [24] measurements, off-specular non-polarised [25] and polarised neutron reflectometry [26,27] and, recently, soft-X-ray resonant magnetic diffuse scattering [28] have been used to estimate the AF-domain-size distribution in magnetic MLs. In fact, Kerr-microscopy has been performed so far only on thick trilayers [22,23].…”