2003
DOI: 10.1016/s0038-1098(02)00621-x
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Magnetic, optical and transport properties of GaMnN films

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Cited by 37 publications
(25 citation statements)
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“…3. According to our knowledge, there is no reports of MR effect in Ga 1Àx Mn x N films grown by MOCVD, though similar phenomena has been found in Mn-doped GaN films by MBE [14,15] and nanowires by CVD [16]. The observed negative MR in our films may be caused by the interaction of electron carriers with the localized Mn moments.…”
Section: Article In Presssupporting
confidence: 72%
“…3. According to our knowledge, there is no reports of MR effect in Ga 1Àx Mn x N films grown by MOCVD, though similar phenomena has been found in Mn-doped GaN films by MBE [14,15] and nanowires by CVD [16]. The observed negative MR in our films may be caused by the interaction of electron carriers with the localized Mn moments.…”
Section: Article In Presssupporting
confidence: 72%
“…To this end the dilute magnetic semiconductors (DMS) are considered to be an important class of materials. Following the discovery of ferromagnetism in Ga; MnAs [1] and the subsequent theoretical prediction [2] that Mn doped GaN could be ferromagnetic at or above room temperature, numerous attempts have been made to synthesize this promising DMS material [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19]. However, the results have been rather confusing.…”
mentioning
confidence: 99%
“…Additionally, a satellite peak at 3.35 eV and 3.33 eV have been observed for both the films, and which is presumably assigned to a band-to-band like transition in Mn doped GaN due to the formation of p-d hybridized states, which is important for carrier induced ferromagnetism. According to the earlier investigators, the near band edge was observed at 3.41 eV at low temperature, and those films also exhibited a broad peak at 2.4 eV and which could be originated by the grease applied during the measurements [21,22]. The emission at 590 nm was reported and assigned to the Mn 2+ ( 4 T 1 !…”
Section: Structural Studiesmentioning
confidence: 85%