2006
DOI: 10.1063/1.2195781
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Magnetic properties and microstructures of FePt∕Ti bilayer films sputter deposited onto glass amorphous substrates

Abstract: FePt ∕ Ti granular films were fabricated onto glass amorphous substrates using a dc facing-target magnetron sputtering system at various Ti underlayer thickness, then annealed at temperature Ta ranging from 200 to 700°C. In the FePt(30nm)∕Ti(1nm) film annealed at 600°C, the coercivity about 12kOe is obtained. The results of x-ray diffraction indicate that a ternary FePtTi alloy is formed. Thus, the formation of the ternary FePtTi alloy is considered to play an important role in magnetic properties.

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Cited by 19 publications
(7 citation statements)
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“…The compositions of FePt and AgCu films were determined to be Fe 49. 6 Pt 50.4 and about Ag 69.1 Cu 30.9 by X-ray fluorescence (XRF). The films were annealed at 300-500 1C in a vacuum furnace with a pressure about 5.0 Â 10 À4 Pa, and the annealing time was fixed at 2 h. The crystal structures of the films were characterized in y-2y geometry X-ray diffraction (XRD) on a Rigaku D/max-2500 diffractometer with Cu Ka radiation, and X-ray reflectivities (XRR) of the as-deposited and annealed films were measured on a Philips X'Pert X-ray diffractometer with Cu Ka radiation.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The compositions of FePt and AgCu films were determined to be Fe 49. 6 Pt 50.4 and about Ag 69.1 Cu 30.9 by X-ray fluorescence (XRF). The films were annealed at 300-500 1C in a vacuum furnace with a pressure about 5.0 Â 10 À4 Pa, and the annealing time was fixed at 2 h. The crystal structures of the films were characterized in y-2y geometry X-ray diffraction (XRD) on a Rigaku D/max-2500 diffractometer with Cu Ka radiation, and X-ray reflectivities (XRR) of the as-deposited and annealed films were measured on a Philips X'Pert X-ray diffractometer with Cu Ka radiation.…”
Section: Methodsmentioning
confidence: 99%
“…The high processing temperature results in large grains and increasing media noise, which are the main disadvantages for practical recording applications of the film. Therefore, many methods have been adopted to reduce the processing temperature, such as the introduction of underlayer [3][4][5][6] or top layer [7], the addition of third elements [8,9], multilayering [10,11], ion irradiation [12,13], in situ annealing [14,15], alternate monatomic layer deposition [16], and dynamic stress-induced ordering [17], and so on. In the present study, we present a simple method to get L1 0 FePt film at lower temperature with acceptable coercivity using AgCu underlayer.…”
Section: Introductionmentioning
confidence: 99%
“…Many seed layers promoting L1 0 FePt (001) perpendicular orientation with (200) textured underlayers have been studied, including Pt/Cr , CrRu , RuAl , TiN , Cr , CrMo , Ti , TiC , Ag , and MgO . The current focus is 5–15 nm thick fcc MgO (200) seed layers with <001> orientation and 9% mismatch with FePt.…”
Section: Sputtered Hamr Mediamentioning
confidence: 99%
“…Recent studies in FePt systems have focused on the directions to reduce the ordering temperature, enhance the coercivity, inhibit grain growth, and promote perpendicular magnetic anisotropy. In most previous investigations of the third element additive into FePt systems such as Au, Ag, Cu, Zn, Ru, P, Ti, SiO 2 , and MgO were in order to improve the above properties of the FePt [8][9][10][11][12][13][14][15][16][17][18][19][20]. The first aim of this work is to enhance the coercivity and control the microstructure of the FePt films.…”
Section: Introductionmentioning
confidence: 99%