1999
DOI: 10.1103/physrevb.59.11897
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Magnetic properties of Co/Rehcp(101¯0)superlattices

Abstract: hcp(101 0) Co/Re superlattices were grown via magnetron sputtering on Al 2 O 3 (112 0) substrates. The thickness of the Co layers was approximately 1.8 nm with the Re layer thickness varying between 0.5 nm and 3.0 nm. Low angle x-ray reflectivity revealed that for our growth conditions the interfacial roughness is approximately 0.4 nm in each material at each interface. High angle x-ray diffraction, together with offspecular x-ray diffraction, showed that the growth is epitaxial with the ͓0001͔ axis in-plane a… Show more

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Cited by 16 publications
(14 citation statements)
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“…It is likely because the large entropy for these interfacial layers would disorder the Co layers, thus lowering its magnetization. This magnetization disordering mechanism is similar to that observed in Co/Re multilayers [20]. Another possibility is that the strains may give rise to the less crystallinity for Co layers.…”
Section: Discussionsupporting
confidence: 53%
“…It is likely because the large entropy for these interfacial layers would disorder the Co layers, thus lowering its magnetization. This magnetization disordering mechanism is similar to that observed in Co/Re multilayers [20]. Another possibility is that the strains may give rise to the less crystallinity for Co layers.…”
Section: Discussionsupporting
confidence: 53%
“…For example, Re, W, and Nb were utilized for many researchers as the seeding layers for preparing high quality Co and Fe films. 2,3 It is noted that the magnetic properties of films will strongly depend on the film structure and the underlying templates ͑substrates or buffer layers͒. 4,5 In this study, cubic zirconia (ZrO 2 ) stabilized with 9.5 mol % Y 2 O 3 ͑YSZ͒ with ͑100͒ and ͑110͒ crystal orientations was chosen as a substrate to study the growth condition for Co films.…”
Section: Introductionmentioning
confidence: 99%
“…High angle x-ray diffraction shows that the superlattices are epitaxial, with the ͓0001͔ direction parallel to the substrate's c axis which lies in the film plane and the ͓101 0͔ lies parallel to the growth direction. 4 Fits to an optical model 5 of the low-angle true specular reflectivity give the actual layer thickness and interface roughness, shown in Table I.…”
Section: Methodsmentioning
confidence: 99%
“…4 A 50 Å buffer layer of Re was deposited at 560°C followed by the growth of the 20 bilayer Co/Re superlattice at 158°C. Four superlattices were grown with a nominal Re thickness of 10 Å and varying Co thickness.…”
Section: Methodsmentioning
confidence: 99%