2003
DOI: 10.1063/1.1537696
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Magnetic properties of Fe thin films on Ag submicrometer islands

Abstract: Face-centered-cubic Ag(100) submicrometer islands on an RCA-cleaned Si(100) substrate were fabricated by molecular beam epitaxy; a 500 Å Fe thin film was then grown onto Ag films at 100 °C. We experimentally demonstrate that the magnetic behavior of Fe films is strongly dependent on the thickness and morphology of the Ag underlayer. The Ag film, in order to reduce the surface free energy, forms isolated three-dimensional square islands with {111} sidewall on the Si(100) substrate. The average height, grain siz… Show more

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Cited by 12 publications
(7 citation statements)
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“…The Ag layer was then deposited on the Si(100) substrate at 500 C by a Kundsen cell with a deposition rate of around 0.05 Å/s in an Eiko EL-10A molecular-beam epitaxy (MBE) deposition system. The same as previous reports [10], Ag films formed face-centered cubic (fcc) (100) structure on Si(100) substrates with a 4:3 coincidence growth. From reflection high-energy electron diffraction (RHEED) [10], we determined the crystal relationship between Ag and Si, that is, .…”
Section: Preparation and Characterization Of Ag Pyramidal Islandssupporting
confidence: 65%
See 4 more Smart Citations
“…The Ag layer was then deposited on the Si(100) substrate at 500 C by a Kundsen cell with a deposition rate of around 0.05 Å/s in an Eiko EL-10A molecular-beam epitaxy (MBE) deposition system. The same as previous reports [10], Ag films formed face-centered cubic (fcc) (100) structure on Si(100) substrates with a 4:3 coincidence growth. From reflection high-energy electron diffraction (RHEED) [10], we determined the crystal relationship between Ag and Si, that is, .…”
Section: Preparation and Characterization Of Ag Pyramidal Islandssupporting
confidence: 65%
“…The same as previous reports [10], Ag films formed face-centered cubic (fcc) (100) structure on Si(100) substrates with a 4:3 coincidence growth. From reflection high-energy electron diffraction (RHEED) [10], we determined the crystal relationship between Ag and Si, that is, . The investigation of atomic force microscopy (AFM) showed that the Ag films formed square-like islands with island edges parallel to in-plane directions, as shown in Fig.…”
Section: Preparation and Characterization Of Ag Pyramidal Islandssupporting
confidence: 65%
See 3 more Smart Citations