Magnetic Resonance Examinations of Patients With Implanted Active Devices. A Low‐Cost Approach in Slew Rate Evaluation

Abstract

Time‐varying magnetic field gradients involved in magnetic resonance examinations can damage implanted electronic systems. The quantity related to this side effect is the gradient slew rate, which is usually not directly available on magnetic resonance console. The present study proposes a low‐cost approach in slew rate assessment, which is useful in risks versus benefits evaluation as well as in sequences optimization. The experimental method is based on an analog circuit, which senses the output voltage of the scanner waveform generator. This allows taking easy and reliable slew rate measurements, even during clinical examinations on patients. Whereas previous studies required managing a considerable amount of data, the present work addresses only the maximal slew rate of any clinical sequence. Experimental results show that the smooth gradient mode, selectable on the two scanners examined, is very effective in patient safety improvement. In particular, it reduces slew rate values in the range from 52.4 up to 132.4 T m‐1 s‐1, i.e. far below the interval 216–346 T m‐1 s‐1, indicated as slew rate tolerance limit of modern implanted electronic devices. Bioelectromagnetics. 2019;40:512–521. © 2019 Bioelectromagnetics Society