Magnetic scanning gate microscopy of a domain wall nanosensor using microparticle probe

Customized MFM probes based on magnetic nanorods

“…Despite the many improvements achieved by the MFM community throughout the years, the intrinsic drawback of this approach is the increase of the final tip radius and a weak control of the magnetic coating influence over the sample magnetic state. Since the invention of Scanning Probe Microscopy (SPM) techniques, research groups [4][5][6][7], as well as commercial companies have offered different solutions to improve resolution and sensitivity and, in the particular case of the MFM, the magnetic stray field created by the tip, which determines the strength of the tip-sample magnetic interaction. The general trend is to deposit a large amount of magnetic material at the tip apex to improve the signal-to-noise ratio (SNR).…”

Hybrid normal metal/ferromagnetic nanojunctions for domain wall tracking

“…Since DW-based nanotechnology requires manipulation of a DW along a nanostructure, the limitation of pinning sites is a major requirement. This explains why longitudinal AMR measurements have been widely used to study magnetization in nanowires 6 , 10 , 13 , 16 – 22 , while there are fewer studies on the transversal PHE at the nanoscale 11 , 15 , 23 .…”

Magnetic imaging using geometrically constrained nano-domain walls

“…However, smaller and more complex nanostructures require not only higher resolution MFM, but also the ability to extract detailed and accurate information about the magnetization of the sample with minimal invasiveness. Thus, the main challenges that modern MFM technology is facing are i) to increase the sensitivity (both magnetic sensitivity and spatial resolution) 7 and ii) to minimize the mutual interference between the probe and sample magnetization [8][9][10][11] . The latter requirement translates naturally into the need to use low magnetic moment probes with high coercivity.…”