Investigations of the structure and dynamics of materials have been an important and essential endeavor in condensed matter physics since the early 20th century. Both neutron and x‐ray scattering techniques have been used extensively to study the crystallographic structure of materials and provide complementary views of structure. For example, x‐ray diffraction has largely been applied to detailed crystallographic structure determination while neutron scattering has traditionally been the standard tool for studies of magnetic structure and the dynamics of condensed matter systems. The principle interaction that makes structure determination possible for x‐rays is the Coulomb interaction between x‐rays and the electronic distribution that gives rise to driven harmonic oscillation of the electrons, and the emission of electric dipole radiation. This is the classical Thomson scattering process. In addition to charge scattering, x‐rays interact with the magnetic moment of the system. When x‐ray energies are tuned through the absorption edges of an element of interest there is a resonant enhancement of the scattering signal now known as x‐ray resonant magnetic scattering. Away from the resonance condition, the magnetic scattering signal is known as nonresonant x‐ray magnetic scattering. In this article, we will concentrate mainly on the basic principles and applications of the x‐ray resonant magnetic scattering and nonresonant magnetic scattering.