2021
DOI: 10.1007/s11664-020-08647-0
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Magnetization and Magnetic Microscopy Studies in Fe Thin Films

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“…Both are affected by many factors. Thus, for the free F layer the resonance field depends on the layer's saturation magnetization, surface anisotropy, and uniaxial magnetocrystalline anisotropy [11][12][13]. In the case of F/AF polycrystalline thin films, the structures resonance field is additionally affected by exchange bias due to the exchange interaction with AF spins and by rotatable anisotropy due to the presence of small unstable AF grains in which the AF magnetization rotates irreversibly as the FM magnetization is in rotation [14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%
“…Both are affected by many factors. Thus, for the free F layer the resonance field depends on the layer's saturation magnetization, surface anisotropy, and uniaxial magnetocrystalline anisotropy [11][12][13]. In the case of F/AF polycrystalline thin films, the structures resonance field is additionally affected by exchange bias due to the exchange interaction with AF spins and by rotatable anisotropy due to the presence of small unstable AF grains in which the AF magnetization rotates irreversibly as the FM magnetization is in rotation [14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%