2019
DOI: 10.1103/physrevapplied.11.054045
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Magnetoelectric Interactions in Composites of Ferrite Films on Lattice-Matched Substrates and Ferroelectrics

Abstract: The nature of mechanical strain-mediated converse magnetoelectric effect (CME) has been studied in multiferroic composites of single-crystal like thin films of nickel ferrite (NFO) and polycrystalline lead zirconate titanate (PZT). Ferrite films of thickness 0.45 to 1 micron were prepared by Pulsed Laser Deposition on lattice-matched (100) and (110) substrates of magnesium gallate (MGO) and cobalt gallate (CGO) that resulted in elimination of antiphase boundaries and magnetic parameters comparable to bulk sing… Show more

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Cited by 19 publications
(10 citation statements)
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“…One, therefore, anticipates a similar uncertainty in the estimated M s using the measured film thickness. Our current value of 4 M s = 3.5 ± 0.1 kG agrees with previously reported values for PLD films of NFO on MGO 28 .…”
Section: Resultssupporting
confidence: 93%
“…One, therefore, anticipates a similar uncertainty in the estimated M s using the measured film thickness. Our current value of 4 M s = 3.5 ± 0.1 kG agrees with previously reported values for PLD films of NFO on MGO 28 .…”
Section: Resultssupporting
confidence: 93%
“…In composites of PZT or PMN-PT and a micron-thick NFO prepared by chemical vapor deposition techniques A v -values were in the range 0.01–0.08 Oe/V (0.8–6.4 A/mV) 49 . For Fe 3 O 4 films deposited directly onto ferroelectrics A v - values as high as 0.25 Oe/V (20 A/mV) were reported 52 . Composites with films of the ferromagnetic alloy FeGaB and PZT, PMN-PT or PZN-PT were studied specifically for applications in tunable inductors and were found to show strong ME coupling 54 .…”
Section: Theory and Discussionmentioning
confidence: 99%
“…Для измерения магнитострикции, как правило, используются тензодатчики, которые вносят дополнительную погрешность в величину деформации, возникающей под действием магнитного поля. Особенно сильно трудности определения величины магнитострикции проявляются при измерении магнитострикции тонких пленок, выращенных на пьезоэлектрической подложке, которые хорошо зарекомендовали себя в устройствах, основанных на электрическом управлении магнитным резонансом [6,7]. В настоящей работе предложен новый способ определения магнитострикции композиционных мультиферроиков, основанный на измерении МЭ-отклика системы.…”
Section: поступило в редакцию 17 июля 2019 г в окончательной редакциunclassified