2011
DOI: 10.1143/jpsjs.80sa.sa015
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Magnetoresistance and Phase Diagram of Thin-Film UNi2Al3

Abstract: We study the dc resistivity of UNi 2 Al 3 thin films as a function of temperature and magnetic field. We focus on the temperature range around the antiferromagnetic transition (T N ≈ 4 K in zero applied field). From a clear signature of T N in the dc resistance along the crystallographic a-direction, we extract the shape of the magnetic phase diagram. Here we find quantitative differences in comparison to previous studies on bulk crystals.

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Cited by 2 publications
(5 citation statements)
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“…The absence of any field dependence is a further indication that the observed feature is not connected to the antiferromagnetically ordered phase. In the dc resistivity measurements on the same sample, we observed a magnetoresistace of only 4% for an applied field of 7 T. 30 From the accuracy of our transmission measurements, we cannot exclude that the THz conductivity in the measured frequency range changes by a similar, small amount. Thus also the field-dependent behavior of the THz conductivity could match that of the dc conductivity.…”
Section: B Optical Properties In Finite Magnetic Fieldmentioning
confidence: 64%
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“…The absence of any field dependence is a further indication that the observed feature is not connected to the antiferromagnetically ordered phase. In the dc resistivity measurements on the same sample, we observed a magnetoresistace of only 4% for an applied field of 7 T. 30 From the accuracy of our transmission measurements, we cannot exclude that the THz conductivity in the measured frequency range changes by a similar, small amount. Thus also the field-dependent behavior of the THz conductivity could match that of the dc conductivity.…”
Section: B Optical Properties In Finite Magnetic Fieldmentioning
confidence: 64%
“…The sample shows a superconducting transition at T c = 0.46 K and an antiferromagnetically ordered phase below T N = 4.2 K, as determined from the dc resistivity. 30 The residual resistivity ratio (RRR) is 5.5 along the a axis. The substrate YAlO 3 (112) is also anisotropic, 35 and the main optical axes of the YAlO 3 substrate and the UNi 2 Al 3 film, which are equal to the crystallographic axes, are tilted with respect to each other by 45 • .…”
Section: Experimental Methodsmentioning
confidence: 99%
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“…This analysis requires knowledge of the optical properties of the substrate material; we determined these from measurements on an empty YAlO 3 (112) substrate at the same frequencies and temperatures as the UNi 2 Al 3 -film. In the present case, to obtain the optical conductivity of the film quantitatively, we have to modify the conventional analysis procedure due to substrate birefringence [18]. From the transmission and phase data, the anisotropy of the optical response is evident.…”
Section: Resultsmentioning
confidence: 99%