2012
DOI: 10.1149/2.090203jes
|View full text |Cite
|
Sign up to set email alerts
|

Magnetoresistance and Structural Study of Electrodeposited Ni-Cu/Cu Multilayers

Abstract: -Electrodeposition was used to produce Ni-Cu/Cu multilayers by two-pulse plating (galvanostatic/potentiostatic control) from a single sulfate/sulfamate electrolyte at an optimized Cu deposition potential for the first time. Magnetoresistance measurements were carried out at room temperature for the Ni-Cu/Cu multilayers as a function of the Ni-Cu and Cu layer thicknesses and the electrolyte Cu 2+ ion concentration. Multilayers with Cu layer thicknesses above 2 nm exhibited a giant magnetoresistance (GMR) effect… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

2
16
0

Year Published

2013
2013
2023
2023

Publication Types

Select...
7
2

Relationship

2
7

Authors

Journals

citations
Cited by 31 publications
(18 citation statements)
references
References 61 publications
2
16
0
Order By: Relevance
“…The magnitude of the GMR increases monotonously with t Cu and finally reaches saturation as found also in previous studies of ED multilayers. 4,21,[23][24][25] The total GMR of the G/P/G multilayers showed much less variation with Cu layer thickness but the magnetoresistance decomposition analysis has shown that the GMR FM contribution reduces strongly toward smaller Cu layer thicknesses. At the same time, the relative weight of the SPM contribution increased here and this could mainly be ascribed to an increased Cu content in the magnetic layers for small Cu layer thicknesses.…”
Section: Discussionmentioning
confidence: 99%
“…The magnitude of the GMR increases monotonously with t Cu and finally reaches saturation as found also in previous studies of ED multilayers. 4,21,[23][24][25] The total GMR of the G/P/G multilayers showed much less variation with Cu layer thickness but the magnetoresistance decomposition analysis has shown that the GMR FM contribution reduces strongly toward smaller Cu layer thicknesses. At the same time, the relative weight of the SPM contribution increased here and this could mainly be ascribed to an increased Cu content in the magnetic layers for small Cu layer thicknesses.…”
Section: Discussionmentioning
confidence: 99%
“…However, contributions from SPM and FM regions within thin magnetic layers are thickness dependent as reported by previous investigators [13,[15][16][17]19] and the coherent layered structure forms at relatively higher t Co . More recent investigations on Co-Cu/Cu [21] and Ni-Cu/Cu [22] multilayers, Bakonyi et al found absence of antiferromagnetic exchange coupling between alternate FM layers in such ECD multilayers. Deposition of Co/Cu multilayers on different semiconducting substrates was found to have significant role onto the resulting MR behaviour because of their changed epitaxy [23].…”
Section: Introductionmentioning
confidence: 94%
“…[28][29][30], Ni/Cu (Ref. 31) and Ni-Co/Cu (Refs. 32-35) multilayers, no oscillatory GMR could be observed for ED Fe-Co/Cu multilayers either, only a monotonous increase up to a certain d Cu value and a decrease for thicker non-magnetic layers, for the higher Fe content multilayers even vanishing here.…”
Section: Gmr In Ed Fe-co/cu Multilayersmentioning
confidence: 99%