2001
DOI: 10.1088/0953-8984/14/3/316
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Magnetoresistance of amorphous indium oxide films at the region of weak-strong localization crossover

Abstract: The magnetoresistance (MR) was measured in films of amorphous indium oxide at the region of weak-strong localization crossover (WSLC). The change from positive to negative MR was observed commonly in the samples as temperature increased, passing through 8-10 K, which falls within the WSLC region of each sample. The observed MR is fitted to a formula composed of the intrastate interaction and the delocalization (DL) terms. The fitting results show that the intrastate interaction term remains up to the hig… Show more

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Cited by 5 publications
(3 citation statements)
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“…Results of MC measurements on In x O films were reported by Lee et al [26]. Their results differed from ours; they observed positive MC only above 8-10K while the low field MC became negative at lower temperatures.…”
Section: Resultscontrasting
confidence: 75%
“…Results of MC measurements on In x O films were reported by Lee et al [26]. Their results differed from ours; they observed positive MC only above 8-10K while the low field MC became negative at lower temperatures.…”
Section: Resultscontrasting
confidence: 75%
“…One way to prove this is by confirming magnetoresistance in the system. Figure 3(c) shows the room-temperature magnetoresistance curve of an FDTO film deposited at 2 × 10 −6 Torr, demonstrating positive magnetoresistance where resistance increases with increasing magnetic field, a phenomenon that has been reported in several disordered and granular magnetic systems [44][45][46][47][48] . Although the %MR in FDTO is lower than that in Fe 3 O 4 , the existence of magnetoresistance confirmed the coupling between spin and charge carriers in FDTO, and hence consolidating its utility towards magnetoelectric devices.…”
Section: Resultsmentioning
confidence: 55%
“…͑1͒ and ͑2͒, although derived on the condition of k F l ӷ 1, can be applied in a strongly localized 2D electron gas with k F l = 0.5-2. Lee et al 7 also showed the validity of Eq. ͑2͒ beyond the WL regime.…”
mentioning
confidence: 81%