Hall effect measurements as a function of magnetic field up to 2.3 T, performed in the temperature range between 3.3 and 12 K, have been used to investigate the electronic transport properties of modulation-doped In 0.53 Ga 0.47 As/In 0.52 Al 0.48 As heterojunctions with single-or double-subband occupancy. The carrier density (N i ) in each subband, the Fermi energy (E F --E i ) with respect to subband energy and subband separation (E 2 --E 1 ) have been determined from the periods of the quantum oscillations in Hall resistance. The in-plane effective mass (m * ) and the quantum lifetime (t q ) of 2D electrons in each subband have been obtained from the temperature and magnetic field dependences of the amplitude of the Hall oscillations, respectively. The results found for N i , E F --E i , E 2 --E 1 , m * and t q are in good agreement with those determined from Shubnikov-de Haas effect in magnetoresistance. It is shown that the experimental technique employed in the current study is equally successful in determining the effective scattering mechanisms in highly-degenerate 2D structures at low temperatures. The results obtained for transport-to-quantum lifetime ratio suggest that the scattering of electrons in the first subband of modulation-doped In 0.53 Ga 0.47 As/ In 0.52 Al 0.48 As heterojunctions is, on average, forward displaced in momentum space, while the scattering of electrons in the second subband contains some contribution from large-angle scattering.