There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback or can be used without access to the distal side of the scatterer. Among all the wave-front shaping techniques, retrieving the transmission matrix of a scattering material is the only one that allows for focusing on multiple spots after a single set of measurements. Here we propose a method to retrieve the transmission matrix of a scatterer using fluorescence light as feedback without access to the distal side. The advantage of this method is that it allows focusing on the whole field of view after a single matrix measurement without affecting the sample, making it suitable for reflection epi-illumination geometry microscopy.Introduction. Fluorescence microscopy is widely used for a diversity of samples due to its high contrast, capability of targeting specific structures, and minimal toxicity, which enable dynamic, structural, and molecular interaction studies. However, when it comes to thick or highly scattering samples, the fluorescent signal is degraded. Confocal and multiphoton microscopy give good resolution but depend on ballistic light to focus through the scattering layers [ 1 , 2 ]. When only a speckle pattern reaches the target, wavefront shaping offers a promising opportunity. Several methods have been developed to create a focus behind a turbid layer using the output speckle field as feedback [ 3 ] in an iterative process. Alternatively, the transmission matrix (TM) approach characterizes the medium with a set of input-output measurements that can be used to generate spots over a wide field of view [ 4 ]. In particular, scattered light fluorescence microscopy has shown subwavelength imaging resolution [ 5 ]. The method uses the transmitted speckle field as feedback to create a focus and by scanning it, within the so called memory effect range [ 6 ], images small structures behind highly scattering materials [ 5 , 7 ]. By adding a curvature on the optimized phase mask, scanning within the memory effect range in three dimensions has been demonstrated as well [ 8 ]. Both transmission and reflection geometry have been studied [ 3 , 5 , 7 , 8 ], paving the way to imaging behind or inside turbid media. Another interesting approach combines the advantages of structured illumination microscopy and wavefront shaping to generate a light-sheet behind a turbid medium, enhancing the signal of fluorescent beads by a factor of ~8 [ 9 ]. Most demonstrations of these wavefront shaping methods have provided very good resolution behind a scattering medium, but