Manipulation of subsurface carbon nanoparticles inBi2Sr2CaCu2O8+δusing a scanning tunneling microscope

Abstract

We present evidence that subsurface carbon nanoparticles in Bi 2 Sr 2 CaCu 2 O 8+δ can be manipulated with nanometer precision using a scanning tunneling microscope. High resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV,indicating that the incorporation of carbon locally alters the electronic properties near the surface.

Concentric-ring-grating-induced strong terahertz near-field enhancement on a micro-tip

“…As a result, the longitudinal field will improve the sensitivity of photon-assisted tunneling detection in s-SNOMs based on scanning tunneling microscopy. It also can lower the bias voltage to manipulate particles with the STM tip [41,42].…”