2015
DOI: 10.1039/c4fd00204k
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Mapping atomic motions with ultrabright electrons: towards fundamental limits in space-time resolution

Abstract: The long held objective of directly observing atomic motions during the defining moments of chemistry has been achieved based on ultrabright electron sources that have given rise to a new field of atomically resolved structural dynamics. This class of experiments requires not only simultaneous sub-atomic spatial resolution with temporal resolution on the 100 femtosecond time scale but also has brightness requirements approaching single shot atomic resolution conditions. The brightness condition is in recogniti… Show more

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Cited by 93 publications
(79 citation statements)
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“…Remedies to improve temporal resolution include relativistic electron acceleration (11) or electron bunch compression (12) with 100 fs and 28 fs limits, respectively. Compared to such incoherent scattering of electrons from an electron source off a molecular target, laser induced electron diffraction (LIED) is a self-imaging method based on coherent electron scattering (13)(14)(15)(16)(17).…”
Section: One Sentence Summarymentioning
confidence: 99%
“…Remedies to improve temporal resolution include relativistic electron acceleration (11) or electron bunch compression (12) with 100 fs and 28 fs limits, respectively. Compared to such incoherent scattering of electrons from an electron source off a molecular target, laser induced electron diffraction (LIED) is a self-imaging method based on coherent electron scattering (13)(14)(15)(16)(17).…”
Section: One Sentence Summarymentioning
confidence: 99%
“…This value is on a par with state-of-the-art externally illuminated cathodes 22 and very good when compared to earlier results [23][24][25] or to the theoretical prediction made by the three-step model for photoemission. 26 The transverse coherence length of the electron bunch at the slit position can be estimated from the measured emittance and beam size using the relation 22,27 Using this equation, we obtain L x ¼ 4:1 nm. For the 100 lm core diameter fiber, a similar measurement was carried out, at a higher acceleration voltage of V acc ¼ À1500 V and a slightly changed geometry (see the supplementary material for details).…”
mentioning
confidence: 99%
“…27 The feasibility of this arrangement was tested in a DC electron gun at an acceleration field of 7 MV/m, and beam energy of 70 kV (see the supplementary material for details). Note that these limits were imposed by the experimental setup used for characterization and are not inherent to our source concept.…”
mentioning
confidence: 99%
“…Therefore, the performance of UED can be tremendously improved by using electrons from high brightness MeV electron source, e.g., radio-frequency (rf) photoinjectors [21][22] . Over the past decades, the number of MeV UED instruments has been growing rapidly [23][24][25][26][27][28][29][30] , which provides an excellent opportunity to achieve femtosecond electron microdiffraction. In this Letter, we report on the experimental demonstration of femtosecond MeV electron microdiffraction from the SLAC UED instrument 30 .…”
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confidence: 99%