2007
DOI: 10.5488/cmp.10.4.579
|View full text |Cite
|
Sign up to set email alerts
|

Mapping between two models of etching process

Abstract: We consider two models for the etching processes using numerical simulations based on cellular-automata discrete-lattice approach. In one model we use a uniform etching probability for each surface site. In another model the etching probability at a given site depends on the local environment of this site. In contrast to the first model we have now a non-local description of the surface evolution. It is natural to consider the following question: is this non-locality sufficient to induce new physics? To answer… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2009
2009
2017
2017

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 10 publications
0
2
0
Order By: Relevance
“…In the present study, we propose a simple mesoscopic model of surface destruction processes in NFC materials, which is implemented on two-dimensional lattice with the use of a stochastic algorithm similar to the cellular automata concept [26,27]. It is assumed that the detachment of nanoparticles at the NFC material surface results from the formation of damaged regions and microfracturing in the vicinity of the locations where nuclear decays take place.…”
Section: Introductionmentioning
confidence: 99%
“…In the present study, we propose a simple mesoscopic model of surface destruction processes in NFC materials, which is implemented on two-dimensional lattice with the use of a stochastic algorithm similar to the cellular automata concept [26,27]. It is assumed that the detachment of nanoparticles at the NFC material surface results from the formation of damaged regions and microfracturing in the vicinity of the locations where nuclear decays take place.…”
Section: Introductionmentioning
confidence: 99%
“…Common examples are doped materials [9] and polymers [10]. The simulation of etching process in natural application for percolation simulations as well [11]. The present work is devoted to the solution of some special percolation problems in order to characterize critical behaviour resulting from volume-generated radiation damages in condensed matter.…”
Section: Introductionmentioning
confidence: 99%