“…Since their early development by E. W. Müller, , field electron emission microscopy (FEM) and field ion microscopy (FIM) have been widely used to image and characterize the structure of materials prepared as tips and to follow surface dynamics with nanoscale lateral resolution. Surface diffusion, , adsorption, − and surface segregation , are some of the fields that have been investigated this way. These methods also allow real time reaction kinetics to be observed, as well as morphological changes of the sample, under truly in situ conditions and with a nanometric or, ultimately, atomic resolution. − …”