“…Moreover, synchrotron radiation can be tuned at the desired wavelength, and because of its high intensity, it is also able to detect very low amount of contaminants. Different techniques can be applied using X-rays from synchrotron sources: dual-energy (i.e., imaging of samples at X-ray energy above and below the edge of the heavy elements under study) radiography and tomography (Kaiser et al, 2005(Kaiser et al, , 2007Reale et al, 2008), projection microscopy with zone plate lenses (Yada 2009;Awaji et al, 2001), diffraction microscopy (Shapiro et al, 2005), X-ray scanning transmission microscopy (Hornberger et al, 2007), as well as X-ray microfluorescence.…”