1999
DOI: 10.1017/s1431927600014628
|View full text |Cite
|
Sign up to set email alerts
|

Mapping the Mesoscale Interface Structure in Polycrystalline Materials

Abstract: Using the new method known as Orientation Imaging Microscopy (OIM), characterization of mesoscale aspect of the internal structure of polycrystalline materials in the two-dimensional section plane has become routine. However, in some applications which primarily focus either on the characterization of interface types or on their connectivity, OIM is rather inefficient since only the scan points that lie adjacent to the interfaces are used to determine interface character. When the OIM grid spacing is d… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2007
2007
2021
2021

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 3 publications
0
3
0
Order By: Relevance
“…This approach would not be possible with classical EBSD because a complete scan has to be done first before knowing the contours of all the grains. However, some interesting solutions have been proposed to determine the position of the grain boundaries using the forward-scatter detectors installed around the EBSD screen (FSD diodes) [29], the EBSD screen itself as a detector [30] or using a scanning mesh refinement technique [2,31].…”
Section: Discussionmentioning
confidence: 99%
“…This approach would not be possible with classical EBSD because a complete scan has to be done first before knowing the contours of all the grains. However, some interesting solutions have been proposed to determine the position of the grain boundaries using the forward-scatter detectors installed around the EBSD screen (FSD diodes) [29], the EBSD screen itself as a detector [30] or using a scanning mesh refinement technique [2,31].…”
Section: Discussionmentioning
confidence: 99%
“…This motivated the acquisition of the preliminary undistorted and undeformed reference (Fig. 1, (3)) since it allows for a spatial distortion correction of EBSD data as proposed by [23][24][25]. To reduce spatial distortions in the reference SEM image (3) and SEM image after fatigue (7), high magnifications, long dwell times, and low working distances were utilized here as suggested by [26].…”
Section: Specimen Fabrication and Characterizationmentioning
confidence: 99%
“…Second, each sample (also called the representative volume element or RVE) is expected to be sufficiently large in size so that the measured distributions from the different samples of the ensemble are sufficiently close to each other (within a specified acceptable tolerance). Third, because most measurement probes used are unable to interrogate the interior of a material, one has to either employ stereology principles on a set of judiciously selected 2D sections of the sample [29] or recent advances in automated serial sectioning [30][31][32] to reconstruct the internal structure of the material, and then extract the distributions (described earlier) from those reconstructions. The recent advances in 3D X-ray tomography offer tremendous promise in this regard [33,34].…”
Section: Statistical Description Of the Spatial Correlation Of The Local Statementioning
confidence: 99%