Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation

Farayola, Praise O.; Bruce, Isaac; Chaganti, Shravan K.; Sheikh, Abalhassan; Ravi, S.; Chen, Degang

doi:10.1109/dtis53253.2021.9505144

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Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation

Cited by 7 publications

References 10 publications

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing

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