1975 Ultrasonics Symposium 1975
DOI: 10.1109/ultsym.1975.196571
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Material Parameters of the Temperature-Stable Si0<inf>2</inf>/ YZ LiTaO<inf>3</inf>Structure

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Cited by 2 publications
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“…1 ¼ 6:49%, and K 2 2 ¼ 2:92%. Comparing the simulation data with the measurement results, the measured coupling coefficient approximates K 2 2 , which implies that the measured device was fabricated on the upper surface of AlN/À52 Y-X LiNbO 3 .…”
Section: Resultsmentioning
confidence: 61%
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“…1 ¼ 6:49%, and K 2 2 ¼ 2:92%. Comparing the simulation data with the measurement results, the measured coupling coefficient approximates K 2 2 , which implies that the measured device was fabricated on the upper surface of AlN/À52 Y-X LiNbO 3 .…”
Section: Resultsmentioning
confidence: 61%
“…In the same region, K 2 2 decreases monotonically. Although a maximum value of approximately 6.76% is obtained for K 2 1 , this occurred in the leaky wave region with a very high attenuation coefficient of 2:51 Â 10 À3 .…”
Section: Resultsmentioning
confidence: 87%
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