2017
DOI: 10.1111/jmi.12500
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Matrices pattern using FIB; ‘Out‐of‐the‐box’ way of thinking

Abstract: Focused ion beam (FIB) is an extremely valuable tool in nanopatterning and nanofabrication for potentially high-resolution patterning, especially when refers to He ion beam microscopy. The work presented here demonstrates an 'out-of-the-box' method of writing using FIB, which enables creating very large matrices, up to the beam-shift limitation, in short times and with high accuracy unachievable by any other writing technique. The new method allows combining different shapes in nanometric dimensions and high r… Show more

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“…While other microscopy parameters, such as the stage position, can be controlled via an application programming interface (API) or patterning options of the manufacturer, large-area patterning can be automated by FIB-o-mat. Another interesting approach for the automation of small and regularly arranged patterns makes use of the pitch in high-level patterns [ 31 ]. When setting the pitch of a 10 μm rectangle to 10 nm, an array of 1000 × 1000 holes with 10 nm spacing may be created.…”
Section: The Fib-o-mat Toolboxmentioning
confidence: 99%
“…While other microscopy parameters, such as the stage position, can be controlled via an application programming interface (API) or patterning options of the manufacturer, large-area patterning can be automated by FIB-o-mat. Another interesting approach for the automation of small and regularly arranged patterns makes use of the pitch in high-level patterns [ 31 ]. When setting the pitch of a 10 μm rectangle to 10 nm, an array of 1000 × 1000 holes with 10 nm spacing may be created.…”
Section: The Fib-o-mat Toolboxmentioning
confidence: 99%