Abstract:Thick targets consisting in Al/Si alloys were bombarded with 1.0 to 5.0 MeV Ar ions. The K X-ray production cross sections were deduced from the measured yields by using the Merzbacher-Lewis formula extended to heavy ion bombardment. The density dependence on the K X-ray production cross sections of Al and Si was observed. This phenomena can be interpreted within the molecular orbital double-scattering mechanism.
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