2013
DOI: 10.1134/s1063782613030263
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Maximum drift velocity of electrons in selectively doped InAlAs/InGaAs/InAlAs heterostructures with InAs inserts

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Cited by 9 publications
(2 citation statements)
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“…Also, through in-situ epitaxial growth, a high quality interface between InGaAs and InAlAs can be obtained. 15,16 However, the interface between the barrier layer and high-k oxide still plays an active role in device operation, having an impact on sub threshold swing 9 and the threshold voltage. 17 As such it is still necessary to characterize and investigate the surface and interface reactions that take place during surface preparations and after subsequent oxide depositions on this surface.…”
Section: Introductionmentioning
confidence: 99%
“…Also, through in-situ epitaxial growth, a high quality interface between InGaAs and InAlAs can be obtained. 15,16 However, the interface between the barrier layer and high-k oxide still plays an active role in device operation, having an impact on sub threshold swing 9 and the threshold voltage. 17 As such it is still necessary to characterize and investigate the surface and interface reactions that take place during surface preparations and after subsequent oxide depositions on this surface.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, the possibility of modifying the transport characteristics of the electron gas in het erostructures using different functional layer inserts in composite QWs (CQWs) has been widely investigated. In particular, the insertion of nanoscale InAs layers into the InAlAs/InGaAs/InAlAs QW allows the mobility and maximum drift velocity of electrons to be increased [3,4], and also effective mass of electrons to be reduced [5,6]. Another way of improving the char acteristics of electron transport lies in the reduction of electron-phonon scattering in a QW due to phonon spectrum variation with the use of GaAs, AlAs, and InAs layers [7][8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%