Mean depth of X‐ray production by electron beams in thick targets

Gaber, M.; El-Khier, A. A. Abou

doi:10.1002/xrs.1300190409

Cited by 3 publications

(1 citation statement)

References 16 publications

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“…To facilitate obtaining (m/r)(E) from equation ( 15), we will assume that X-rays are generated at a single point inside the specimen. The mean depth rz of X-ray emission can be estimated as (Gaber & El-Khier, 1990)…”

Section: Correction Of Self-absorptionmentioning

confidence: 99%

Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption

2021

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Electron microprobe-based quantitative compositional measurement of first-row transition metals using their L $\alpha$ X-ray lines is hampered by, among other effects, self-absorption. This effect, which occurs when a broad X-ray line is located close to a broad absorption edge, is not accounted for by matrix corrections. To assess the error due to neglecting self-absorption, we calculate the L $\alpha$ X-ray intensity emitted from metallic Fe, Ni, Cu, and Zn targets, assuming a Lorentzian profile for the X-ray line and taking into account the energy dependence of the mass absorption coefficient near the absorption edge. We find that calculated X-ray intensities depart increasingly, for increasing electron beam energy, from those obtained assuming a narrow X-ray line and a single fixed absorption coefficient (conventional approach), with a maximum deviation of $\sim$ 15% for Ni and of $\sim$ 10% for Fe. In contrast, X-ray intensities calculated for metallic Zn and Cu do not differ significantly from those obtained using the conventional approach. The implications of these results for the analysis of transition-metal compounds by electron probe microanalysis as well as strategies to account for self-absorption effects are discussed.

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Section: Correction Of Self-absorptionmentioning

confidence: 99%

Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption

2021

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Absorption correction in electron probe microanalysis

Gaber

1992

X-Ray Spectrometry

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The absorption correction factor f(χ) is calculated by using an empirical equation based on a new shape of the x‐ray depth distribution function Φ(ρz). It assumed that Φ(ρz) increases firstly linearly with the depth ρz up to the depth ρzm at which the function Φ(ρz) reaches its maximum value Φm, and subsequently the function Φ(ρz) decreases exponentially with increasing ρz. The proposed f(χ) equation is a function of the parameters ρzm, Φm and the mean depth of x‐ray production ρz. Based on Monte Carlo calculations, the variation of these parameters with the target atomic number Z, the incident electron energy E0 and the critical energy Ec was studied and empirical expressions were deduced. The calculated parameters were compared with experimental results. The factor f(χ) was calculated and compared with some measurements. The comparison gives an RMS error of 1.88%. The proposed equation was applied to 680 microanalysis data (including light elements). The results gave a relative deviation of about 3%, compared with 4.27% obtained by the quadrilateral model. For high absorbing systems (absorption factor ≤0.5), the present model gave an RMS error of 4.72% compared with 8.18% obtained by the quadrilateral model.

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Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra

Terauchi,

Sato,

Yokoyama

et al. 2024

Microscopy

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This study proposes a simple evaluation method for deriving L-absorption information from two L-emission spectra of 3d transition metal (TM) elements obtained at two different accelerating voltages. This method realizes a spatial identity for X-ray emission and absorption spectroscopies. This method was evaluated for the Fe L-emission spectra of Fe and its oxides, and was applied to the TM L-emission spectra of MnO, Co, CoO, and NiO. The derived absorption peak positions were consistent with those obtained previously at synchrotron orbital radiation facilities, which considered the core-hole effect. This simple derivation method could be useful for obtaining X-ray absorption spectroscopy distribution images from X-ray emission spectroscopy mapping data obtained by scanning electron microscopy.

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Mean depth of X‐ray production by electron beams in thick targets

Cited by 3 publications

References 16 publications

Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption

Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption

Absorption correction in electron probe microanalysis

Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra

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