Mean free path and density of conductance electrons in platinum determined by the size effect in extremely thin films

Fischer, Gerd; Hoffmann, H.; Vancea, Johann

doi:10.1103/physrevb.22.6065

Cited by 132 publications

(70 citation statements)

References 15 publications

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“…From the fit, it is found that ͓͑T͒͑T͔͒ Pt =8ϫ 10 −11 ⍀ cm 2 , in good agreement with the value reported by Fischer et al for 2 nm thick Pt films ͑2 ϫ 10 −11 ⍀ cm 2 ͒. 35 In our NW, an enhanced value for the quantity ͓͑T͒͑T͔͒ Pt is reasonable because the number of carriers is greater than in ultrathin films, due to the fact that a lower-defect density is expected. The fit result for the specular scattering coefficient is p FS = 0.177, very close to the values reported by , and the grain-boundary reflection coefficient R gr = 0.227, is comparable with the values obtained for thin Au films (0.295), for Cu (0.24), and for Al (0.17).…”

Section: ͑3͒supporting

confidence: 79%

“…The fit result for the specular scattering coefficient is p FS = 0.177, very close to the values reported by , and the grain-boundary reflection coefficient R gr = 0.227, is comparable with the values obtained for thin Au films (0.295), for Cu (0.24), and for Al (0.17). 32,34,35 The mean average grain diameter extracted from the fit is 21 nm, consistent with measured grain sizes ͑20-30 nm͒ in HRSEM images. This combined model allows the relative magnitude of the grainboundary and the surface-scattering contributions to be estimated: grain-boundary scattering dominates over surface scattering at all temperatures by a factor of two.…”

Section: ͑3͒supporting

confidence: 54%

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Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

Marzi¹,

Iacopino²,

Quinn³

et al. 2004

Journal of Applied Physics

106

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Access to the full text of the published version may require a subscription. Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam The transport characteristics of 70-nm-diameter platinum nanowires (NWs), fabricated using a pore-templated electrodeposition process and individually contacted using a focused ion beam (FIB) method, are reported. This approach yields nanowire devices with low contact resistances ͑ϳ400 ⍀͒ and linear current-voltage characteristics for current densities up to 65 kA/ cm 2 . The intrinsic nanowire resistivity ͑33± 5 ⍀ cm͒ indicates significant contributions from surface-and grain-boundary scattering mechanisms. Fits to the temperature dependence of the intrinsic NW resistance confirm that grain-boundary scattering dominates surface scattering (by more than a factor of 2) at all temperatures. Our results demonstrate that FIB presents a rapid and flexible method for the formation of low-resistance ohmic contacts to individual metal nanowires, allowing intrinsic nanowire transport properties to be probed. Rights

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Section: ͑3͒supporting

confidence: 79%

Section: ͑3͒supporting

confidence: 54%

Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

Marzi¹,

Iacopino²,

Quinn³

et al. 2004

Journal of Applied Physics

106

View full text Add to dashboard Cite

show abstract

“…Note that, in the approximation B0, Eq. (1) leads to the standard SMR relation [11,28] Einstein relation is not trivial since it is a two-band metal with a complex Fermi surface and, furthermore, the density of states can differ from the bulk value [56,57], which is the reason for the lack of reference values. Therefore, our model gives a powerful alternative to the current methods used to extract an effective diffusion coefficient in ultrathin metal films.…”

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confidence: 99%

Hanle Magnetoresistance in Thin Metal Films with Strong Spin-Orbit Coupling

Vélez¹,

Golovach²,

et al. 2016

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We report measurements of a new type of magnetoresistance in Pt and Ta thin films. The spin accumulation created at the surfaces of the film by the spin Hall effect decreases in a magnetic field because of the Hanle effect, resulting in an increase of the electrical resistance as predicted by Dyakonov [PRL 99, 126601 (2007)]. The angular dependence of this magnetoresistance resembles the recently discovered spin Hall magnetoresistance in Pt/Y 3 Fe 5 O 12 bilayers, although the presence of a ferromagnetic insulator is not required. We show that this Hanle magnetoresistance is an alternative, simple way to quantitatively study the coupling between charge and spin currents in metals with strong spin-orbit coupling.Spin-orbit interaction is an essential ingredient in materials and interfaces, offering the possibility to exploit the coupling between spin and orbital degrees of freedom of electrons in spintronic devices [1,2]. Of utmost importance are the spin Hall (SHE) and inverse spin Hall (ISHE) effects, which convert charge currents into transverse spin currents and vice versa, allowing us to create and detect spin currents in materials with strong spin-orbit coupling (SOC) [3][4][5][6][7][8]. In this framework, a new type of magnetoresistance (MR), spin Hall magnetoresistance (SMR), was discovered in nonmagnetic (NM) metal/ferromagnetic insulator (FMI) bilayers [9][10][11][12][13][14][15][16]. SMR arises from the simultaneous effect of SHE and ISHE in the NM layer -which leads to a decrease in its resistance-combined with the presence of a FMI at one of

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“…It is generally 0.0034/°C. This measured value is lower than the theoretical value of bulk pure Pt (0.0039/°C) because the electron scattering would be cause grain not be density during the film sputtering [16]. Of course, the deviation will also be caused by fabrication parameters, testing method, etc.…”

Section: Thin Film Processes -Artifacts On Surface Phenomena and Techmentioning

confidence: 65%

Lab-on-a-Tube Surface Micromachining Technology

Yang¹,

Zhang²

2017

Thin Film Processes - Artifacts on Surface Phenomena and Technological Facets

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In this chapter, the lab-on-a-tube surface micromachining technology will be used to fabricate a flexible implantable microtemperature sensor for hyperthermia application and a three-electrode system on a polymer tube surface for glucose monitoring application. This micromachining process is based on two homemade equipments: a spray coating equipment and a programmable UV 3D projection lithography system with alignment. In the spray coating system, there is a heater nozzle next to the spray nozzle for real-time heating. Pure nitrogen is flowed through the heater nozzle, warmed up and sprayed onto the tube substrate surface. The programmable UV lithography equipment for cylindrical substrate mainly consists of four parts: a uniform illumination system, a reduced projection lithography system, a synchronized motion stage system, and a Charge-Coupled Device (CCD) multilayer alignment system which is used to observe simultaneously the projected mask's patterns and those ever fabricated on the tube. Using the developed labon-a-tube surface micromachining technology, an implantable flexible microtemperature sensor and a three-electrode microstructure are successfully fabricated on the flexible polymer tube with 330 μm outer diameter, respectively. The test temperature coefficient of resistance (TCR) of the temperature sensor is 0.0034/°C. The measured cyclic voltammetry curve shows that the three-electrode system has a good redox property.

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Mean free path and density of conductance electrons in platinum determined by the size effect in extremely thin films

Cited by 132 publications

References 15 publications

Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

Hanle Magnetoresistance in Thin Metal Films with Strong Spin-Orbit Coupling

Lab-on-a-Tube Surface Micromachining Technology

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