2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 2018
DOI: 10.23919/eos/esd.2018.8509690
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Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs

Myeong-Jo Jeong
1
,
Junsik Park
2
,
Jin-Woo Kim
3
et al.
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