2007
DOI: 10.1143/jjap.46.1989
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Measurement of Alignment Accuracy for Wafer Bonding by Moiré Method

Abstract: A centrosymmetric square grating was developed in this paper. Moire ´fringes produced by the two centrosymmetric square gratings are highly sensitive with the misalignments and misaligned directions. The distance between the mismatched moire fringes are expected to be measured directly by an infrared (IR) microscope without requiring any external reference. Using two pair of the moire ´square gratings, misalignments of bonded wafers are proposed to be measured in the X-Y-axis simultaneously on wafer scale. The… Show more

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Cited by 5 publications
(1 citation statement)
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“…In recent years, we demonstrated a moiré fringe assisted alignment method using centrosymmetric gratings, which exhibited many advantages over conventional moiré gratings [15,16]. For instance, small planar misalignments and misaligned directions can be easily measured without requiring any external reference.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, we demonstrated a moiré fringe assisted alignment method using centrosymmetric gratings, which exhibited many advantages over conventional moiré gratings [15,16]. For instance, small planar misalignments and misaligned directions can be easily measured without requiring any external reference.…”
Section: Introductionmentioning
confidence: 99%